[Spm] SPM Course

[Sharon Coe]

Scanning Probe Microscopy:
 From Fundamentals to Advanced Applications
June 14-17, 2010
Lehigh University
Bethlehem, PA

This course provides an understanding of the concepts, instrumentation, 
and applications of the rapidly expanding field of Scanning Probe 
Microscopy (SPM). Atomic Force Microscopy (AFM) and Scanning Tunneling 
Microscopy (STM) will be covered extensively, but the course will also 
feature a variety of advanced SPM techniques. The theory of operation 
for both imaging and spectroscopy will be addressed, with special 
attention being paid to instrument artifacts and methods to avoid them. 
Crucially, the course will include nearly equal time spent in 
instruction and hands-on labs. Participants will therefore take away the 
necessary knowledge and practice to utilize the full potential of SPM 
systems for applications in the physical and biological sciences, including:

• Practical and theoretical aspects of AFM and STM operation
• Force-distance measurements (AFM indentation, Force-Volume, molecular 
interactions,
instrumented Nano-indentation)
• Mechanical mapping (Phase imaging, multiple/higher order harmonics)
• Fluid measurements (Living cell work, Electrochemistry)
• Electric field/surface potential imaging
• Magnetic field imaging
• Piezo-force microscopy (PFM)
• Nanolithography
• Image Analysis
• System management and probe selection

Instructors: Nancy Burnham (Worcester Polytechnic Institute), Bryan Huey 
(University of Connecticut), Bruce Koel (Lehigh University), Dmitri 
Vezenov (Lehigh University), Richard Vinci (Lehigh University)

Participating Companies: Agilent Technologies, Asylum Research,
NT-MDT, Veeco Instruments

Each registrant receives the textbook, Scanning Probe Microscopy and 
Spectroscopy: Theory, Techniques, and Applications 2nd Ed., by Dawn 
Bonnell (Wiley 2000), as well as detailed laboratory notes for all 
hands-on exercises. In addition, everyone receives notes for specific 
lectures, a list of vendors and equipment suppliers, and the Lehigh DVD 
that contains free and demonstration versions of useful microscopy 
software. Sample probes from several vendors are also provided with 
support from probe manufacturers.

For more information contact:
Sharon Coe (610-758-5133)
Sharon.coe at lehigh.edu
www.lehigh.edu/microscopy


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Sharon L. Coe
Events Coordinator
Lehigh Microscopy School
5 East Packer Avenue
Bethlehem, PA  18015
610-758-5133 (phone)
610-758-4244 (fax)
slc6 at lehigh.edu
www.lehigh.edu/microscopy

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