[Spm] Postdoctoral position at LNE (French National Institute of Metrology)

[Ducourtieux Sébastien]

Postdoctoral position (18 months) at LNE

Metrology with atomic force microscope : - Roughness at nanometer scale - Imaging for virology

In the framework of two national research projects (Nanoref and Nanovirologie), the French National Institute of Metrology LNE (Laboratoire National de Métrologie et d'Essais) proposes a 18 months postdoctoral position in its research team in fundamental metrology

Description
Since 5 years, the LNE has developed an Atomic Force Microscope (AFM) mainly used for characterization of surfaces and objects at the nanometer scale. In order to increase its activity scope, LNE starts two new projects : 

- The first project, Nanoref, supported by a French Research Agency (ANR) aims at developing a roughness standard with a quasi-continuum spatial frequency spectrum, unavailable today in the nanometric range. The challenge is important since comparison measurements on surface roughness carried out by national and international teams have revealed a disagreement on results, more especially when experimental set ups do not involve the same physical principle. This project consists in determining reproducible fabrication process and conservation of surface standards. The different equipments used for surface state characterization will be compared and analysed. The objective of the postdoctoral fellow will be to participate to the measurement campaign on produced samples and to increase the knowledge on roughness measurement using AFM. 

- The second project, Nanovirology, deals with the observation of virus highly suspected in type 1 diabetes. The AFM imaging of this tiny virus (about 27 nm) should allow our partner, expert in the investigation of this virus, to validate their hypotheses and to test new experimental approaches. This first step in nanobiology should open the way to investigation in the field of nosocomial infections, for example by using AFM to measure the interactive force between the virus and the surface. In this on going project with the ENSAM, the Lille 2 University and the INRIA, the objective of the postdoctoral fellow will be to improve the first results by focusing on instrumental aspects and extracting the maximum of possible information on the studied virus.

Within the research team in fundamental metrology, the postdoctoral fellow will work in collaboration with the dimensional nanometrology team and will participate to the whole activities described above, 66 % devoted to the Nanoref project and the rest of time on the Nanovirology project. We are looking for a PhD or a Research Engineer with two or three years of experience in experimental physics and more specifically in AFM: instrument design, control, precision mechanics, position sensors, programming (Matlab®, Labview®).... A good understanding of imaging processes is required to get the two projects into success. A first experience on AFM measurement in liquid on biological samples and elementary knowledge in metrology will be appreciated.

The position is available immediately.

Contacts :

François PIQUEMAL, francois.piquemal at lne.fr <mailto:francois.piquemal at lne.fr>, tel +33 1 30 69 21 73





Sébastien Ducourtieux

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Laboratoire national de métrologie et d'essais 

CSMI 385 - Unité Nanometrologie Dimensionnelle
Z.A. de Trappes-Elancourt
29, avenue Roger Hennequin
78197 Trappes Cedex
http://www.lne.fr

tel : 33 1 30 69 21 84
fax : 33 1 30 16 28 41
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