[Spm] RE: Spm Digest, Vol 37, Issue 10
Igor Sokolov
isokolov at clarkson.edu
Thu Aug 23 18:43:16 EDT 2007
Dear all,
It was interesting note about using silicon and duplicating tape.
We used silicon-based PDMS (sygard 190 or so) a while ago with a rather
modest success..
I feel it is important to specify which material was used for such "casting
away" the contaminants..
Tania, which specific tape did you use, Acetobutyrate (Tacphan) or Cellulose
Acetate?
Maybe some other suggestions?
Best regards,
Igor
_____________________________________
Igor Sokolov, Ph.D.
Associate Professor,
Departments of Physics, Chemistry,
Center for Advanced Materials Processing,
Clarkson University,
Potsdam, NY 13699-5820, USA
office: 315-268-2375
fax: 315-268-6610
cell: 315-212-4865
Skype: sokig2007
E-mail: isokolov at clarkson.edu
Web: http://www.clarkson.edu/~isokolov/
______________________________________
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Subject: Spm Digest, Vol 37, Issue 10
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Today's Topics:
1. RE: Spm Digest, Vol 37, Issue 8 Cleaning waffle calibration
gratings (Don Chernoff at ASM (Igor Sokolov)
2. Re: Cleaning waffle calibration gratings (trizwan at ualberta.ca)
3.
=?GB2312?B?UmU6IFtTcG1dIENsZWFuaW5nIHdhZmZsZSBjYWxpYnJhdGlvbiBncmF0aW5ncw==?
=
(Yang Gan (8JQt))
----------------------------------------------------------------------
Message: 1
Date: Wed, 22 Aug 2007 12:22:35 -0400
From: "Igor Sokolov" <isokolov at clarkson.edu>
Subject: [Spm] RE: Spm Digest, Vol 37, Issue 8 Cleaning waffle
calibration gratings (Don Chernoff at ASM
To: <spm at spmlist.di.com>
Message-ID: <017601c7e4d8$a5f4ef30$47129980 at sc.clarkson.edu>
Content-Type: text/plain; charset="us-ascii"
Dear Don,
We tried for fun to clean with ultrasonic (also not megasonic) in piranha
acid which partial success (in principle, the quality was not too bad).
Plasma cleaning and even etching with SEM plasma sputter/ cleaner/etcher
gave not a lot success (worth than the piranha treatment). What we have
found the most positive so far is that the flat surface can be cleaned with
ultrapure water and a brush type of polymeric pad used in postCMP
(chemical-mechanical planarizarion) processes to remove abrasive
nanoparticles.
If you find any other good method, please tell me.
Best regards,
Igor
_____________________________________
Igor Sokolov, Ph.D.
Associate Professor,
Departments of Physics, Chemistry,
Center for Advanced Materials Processing, Clarkson University, Potsdam, NY
13699-5820, USA
office: 315-268-2375
fax: 315-268-6610
cell: 315-212-4865
Skype: sokig2007
E-mail: isokolov at clarkson.edu
Web: http://www.clarkson.edu/~isokolov/
______________________________________
------------------------------
Message: 2
Date: Mon, 20 Aug 2007 12:11:59 -0400
From: "Don Chernoff at ASM" <donc at asmicro.com>
Subject: [Spm] Cleaning waffle calibration gratings
To: "SPM List" <spm at spmlist.di.com>
Message-ID: <003101c7e344$d9d143c0$6701a8c0 at asm15>
Content-Type: text/plain; charset="iso-8859-1"
Many AFMs are supplied with a 'waffle grating' to calibrate the XYZ axes.
Typically, the pattern consists of 5 um wide pits on a square grid with 10
um pitch. The pits are normally 180 nm deep (older gratings) or 200 nm deep
(newer gratings). Many of the older gratings seem to accumulate small
bumps (< 0.5 um wide) that are 10-50 nm high.
What cleaning techniques are useful for these gratings so that nano-dirt
does not interfere with the measurements? For example, has anyone tried CO2
snow cleaning? Plasma cleaning?
I myself have tried ultrasonic cleaning, using an ordinary small lab unit
(not megasonic). This succeeded in breaking large clumps into smaller ones
and spreading them across the surface, so that the specimen was less useful
than before.
regards,
Don
=============================================
Don Chernoff, Ph.D., President
Advanced Surface Microscopy, Inc. E-Mail: donc at asmicro.com
3250 N. Post Rd., Ste. 120 Voice: 317-895-5630
INDIANAPOLIS IN 46226 USA Toll free: 800-374-8557 (in USA & Canada)
web: http://www.asmicro.com Fax: 317-895-5652
[business activities: analytical services in AFM, AFM probes, consulting,
training, calibration and test specimens, calibration and measurement
software, used NanoScope equipment.]
=============================================
------------------------------
Message: 2
Date: Wed, 22 Aug 2007 11:58:50 -0600
From: trizwan at ualberta.ca
Subject: [Spm] Re: Cleaning waffle calibration gratings
To: spm at spmlist.di.com
Cc: donc at asmicro.com
Message-ID: <20070822115850.a1iy5522ask84kko at webmail.ualberta.ca>
Content-Type: text/plain; charset=ISO-8859-1; DelSp="Yes";
format="flowed"
Hi Don,
We clean our grating using a replicating tape purchased from Ted Pella Inc.
It works well in removing most of the troublesome contaminants.
All you do is cut a piece of it and place it on the grid surface, put a tiny
drop of acetone on to the tape to dissolve it, allow the acetone to
evaporate out and pull off the tape once it hardens.
Hope this works for you as well.
Regards,
Tania
_________________________________
Tania Rizwan
Graduate Student
Colloids and Complex Fluids (CCF) Lab
Department of Mechanical Engineering
4-9 Mechanical Engineering Building
University of Alberta
Edmonton, AB T6G 2G8
Tel:780-492-9673
Lab:780-492-8722
Fax:780-492-2200
email: trizwan at ualberta.ca
> Date: Mon, 20 Aug 2007 12:11:59 -0400
> From: "Don Chernoff at ASM"
> Subject: [Spm] Cleaning waffle calibration gratings
> To: "SPM List"
> Message-ID: <003101c7e344$d9d143c0$6701a8c0 at asm15>
> Content-Type: text/plain; charset="iso-8859-1"
>
> Many AFMs are supplied with a 'waffle grating' to calibrate the XYZ
> axes. Typically, the pattern consists of 5 um wide pits on a square
> grid with 10 um pitch. The pits are normally 180 nm deep (older
> gratings) or 200 nm deep (newer gratings). Many of the older
> gratings seem to accumulate small bumps (< 0.5 um wide) that are
> 10-50 nm high.
> What cleaning techniques are useful for these gratings so that
> nano-dirt does not interfere with the measurements? For example,
> has anyone tried CO2 snow cleaning? Plasma cleaning?
>
> I myself have tried ultrasonic cleaning, using an ordinary small lab
> unit (not megasonic). This succeeded in breaking large clumps into
> smaller ones and spreading them across the surface, so that the
> specimen was less useful than before.
>
> regards,
> Don
> =============================================
> Don Chernoff, Ph.D., President
> Advanced Surface Microscopy, Inc. E-Mail: donc at asmicro.com
> 3250 N. Post Rd., Ste. 120 Voice: 317-895-5630
> INDIANAPOLIS IN 46226 USA Toll free: 800-374-8557 (in USA & Canada)
> web: http://www.asmicro.com Fax: 317-895-5652
> [business activities: analytical services in AFM, AFM probes,
> consulting, training,
> calibration and test specimens, calibration and measurement software,
> used NanoScope equipment.]
> =============================================
------------------------------
Message: 3
Date: Wed, 22 Aug 2007 16:15:50 +0800
From: "Yang Gan (8JQt)" <ygan at hit.edu.cn>
Subject:
=?GB2312?B?UmU6IFtTcG1dIENsZWFuaW5nIHdhZmZsZSBjYWxpYnJhdGlvbiBncmF0aW5ncw==?
=
To: spm at spmlist.di.com
Cc: donc at asmicro.com
Message-ID: <W01GTPkiEP5m$LEKcZ5LX$uP5nbn4h at ygan>
Content-Type: text/plain
Hi Don,
On your question, I searched the archive and pasted my past message here.
Hope it helps.
Cheers
Yang
Prof. Yang Gan
Department of Applied Chemistry
Harbin Institute of Technology
No.92, West Da-Zhi Street, Harbin
Heilongjiang 150001
P. R. China
>>>>>
Hi Valeria,
Absolutely sonicating will damaging your gratings, the only tip I know is a
"secret" recipe from T. G. Schneider, "Cleaning a calibration standard
grid", appeared in Microscopy Today, April, pp. 35.
He put a drop of silicone onto the grid then peel it off after curing, thus
remove minor trace of dirties on the surface. I have never tried this tip,
so you may find many details from the article above.
As far as I know, this issue is still free to access from the official
website, so enjoy DIY!
Cheers
Yang
>>>>>>
From: "Don Chernoff at ASM" <donc at asmicro.com>
Subject: [Spm] Cleaning waffle calibration gratings
Many AFMs are supplied with a 'waffle grating' to calibrate the XYZ axes.
Typically, the pattern consists of 5 um wide pits on a square grid with 10
um pitch. The pits are normally 180 nm deep (older gratings) or 200 nm deep
(newer gratings). Many of the older gratings seem to accumulate small
bumps (< 0.5 um wide) that are 10-50 nm high.
What cleaning techniques are useful for these gratings so that nano-dirt
does not interfere with the measurements? For example, has anyone tried CO2
snow cleaning? Plasma cleaning?
I myself have tried ultrasonic cleaning, using an ordinary small lab unit
(not megasonic). This succeeded in breaking large clumps into smaller ones
and spreading them across the surface, so that the specimen was less useful
than before.
regards,
Don
=============================================
Don Chernoff, Ph.D., President
Advanced Surface Microscopy, Inc. E-Mail: donc at asmicro.com
3250 N. Post Rd., Ste. 120 Voice: 317-895-5630
INDIANAPOLIS IN 46226 USA Toll free: 800-374-8557 (in USA & Canada)
web: http://www.asmicro.com Fax: 317-895-5652
[business activities: analytical services in AFM, AFM probes, consulting,
training, calibration and test specimens, calibration and measurement
software, used NanoScope equipment.]
=============================================
Prof. Yang Gan
Department of Applied Chemistry
Harbin Institute of Technology
No.92, West Da-Zhi Street, Harbin
Heilongjiang 150001
P. R. China
------------------------------
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